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posted on 2025-11-24, 14:23 authored by Arnoud Onnink, Jurriaan Schmitz, Bas Terbonssen, Alexey KovalginThe online Supporting Information gives details for the simulations in GranFilm; method and accuracy of the EL fits; reproducibility of the ellipsometry data; the effect of angle of incidence on the EL fits; the characterization of TIFs by SEM; and the determination of the oxide shell thickness by XPS as well as SESSA simulations of these XPS spectra.<p></p>
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- 1. DOI - Is supplement to Monitoring the thickness of white Sn thin island films by spectroscopic ellipsometry
