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posted on 2025-07-30, 12:07 authored by Aleksandar Radic, Sam Lambrick, Chenyang Zhao, Nick von Jeinsen, Andrew Jardine, David Ward, Paul Dastoor
Supplementary material for "Heliometric stereo: a new frontier in surface profilometry" containing detailed SHeM imaging parameters for the presented micrographs, and SEM image of sample in Figure 4.

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    Journal of Applied Physics

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    ProfilometryMicroscopyMetrologyAtom scattering

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