Supplementary Material
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posted on 2024-08-14, 04:01 authored by Rubén Corcuera Paños, Pilar Jiménez-Cavero, Rafael del Real, Francisco Rivadulla, Rafael Ramos, José Morales Aragonés, Soraya Sangiao, Cesar Magen, Luis Morellon, Irene LucasXRD profiles in the 20-120 degrees range; XRR profiles and sample properties table; AFM topography of a 4umx4um sectin.
