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posted on 2024-07-10, 12:05 authored by Hitoshi Takane, Shinya Konishi, Yuichiro Hayasaka, Ryo Ota, Takeru Wakamatsu, Yuki Isobe, Kentaro Kaneko, Katsuhisa Tanaka
Details of the XRD and AFM analyses.

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    Journal of Applied Physics

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    SemiconductorDislocation

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