Supplemental Material for "Fault Localization in a Microfabricated Surface Ion Trap using Diamond Nitrogen-Vacancy Center Magnetometry"
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posted on 2024-12-16, 05:02 authored by Pauli Kehayias, Matthew Delaney, Raymond Haltli, Susan Clark, Melissa Revelle, Andrew MounceContains measurements of a second ion trap chip with a different design, and further details of the experiment geometry and ion trap specifications.
