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posted on 2024-08-22, 12:05 authored by Surbhi Yadav, Balaji Birajdar, Simon Kraschewski, Benjamin Apeleo Zubiri, Tobias Antesberger, Martin Stutzmann, Erdmann Spiecker
A plan-view STEM-HAADF electron tomography tilt series (tilt range: {plus minus}74{degree sign}; tilt increment: 1{degree sign}) from a region close to the reaction front of a-Si/Ag/quartz sample in-situ annealed at 500{degree sign}C.

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    Journal of Applied Physics

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