Supplementary material

Curiotto, Stefano; Combe, Nicolas; Muller, Pierre; El-Barraj, Ali; Abu Dahech, Nayef; Cheynis, Fabien; Pierre-Louis, Olivier; Leroy, Frédéric

doi:10.60893/figshare.apl.26936251.v1

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posted on 2024-09-17, 12:01 authored by Stefano Curiotto, Nicolas Combe, Pierre Muller, Ali El-Barraj, Nayef Abu Dahech, Fabien Cheynis, Olivier Pierre-Louis, Frédéric Leroy

Development of the equations on which the model is based

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analytical modeling low energy electron microscopy silicon thermomigration

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