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journal contribution
posted on 2024-09-17, 12:01 authored by Stefano Curiotto, Nicolas Combe, Pierre Muller, Ali El-Barraj, Nayef Abu Dahech, Fabien Cheynis, Olivier Pierre-Louis, Frédéric Leroy
Development of the equations on which the model is based

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    Applied Physics Letters

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    Keywords

    analytical modelinglow energy electron microscopysiliconthermomigration

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    CC BY 4.0

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