Supplementary Materials Sections I, II

Lederer, Jackson; Figueira Nunes, Joao Pedro; Rankine, Conor; Attar, Andrew; Hegazy, Kareem; Ji, Fuhao; Le, Cuong; Lin, Ming-Fu; Liu, Yusong; Luo, Duan; Orr-Ewing, Andrew; Saha, Sajib; Shen, Xiaozhe; Wang, Xijie; Ware, Matthew; Weathersby, Stephen; Wilkin, Kyle; Wolf, Thomas; Xiong, Yanwei; Yang, Jie; Centurion, Martin

doi:10.60893/figshare.jcp.30383917.v1

Supplementary Materials Sections I, II

https://doi.org/10.60893/figshare.jcp.30383917

journal contribution

posted on 2025-11-04, 13:08 authored by Jackson Lederer, Joao Pedro Figueira Nunes, Conor Rankine, Andrew Attar, Kareem Hegazy, Fuhao Ji, Cuong Le, Ming-Fu Lin, Yusong Liu, Duan Luo, Andrew Orr-Ewing, Sajib Saha, Xiaozhe Shen, Xijie Wang, Matthew Ware, Stephen Weathersby, Kyle Wilkin, Thomas Wolf, Yanwei Xiong, Jie Yang, Martin Centurion

The following information can be found in the Supplementary Materials. Supplementary Materials Section I. Diffraction Theory: An overview of the theory used in the analysis of electron diffraction data. Supplementary Materials Section II. Data Processing & Additional Analysis Steps: An explanation of the steps taken to process the raw diffraction images into the signals used in the data analysis.