Supplementary Material

Wei, Tong; Fenimore, Logan; Lan, Tian; Torkelson, John

doi:10.60893/figshare.jcp.30213790.v1

Supplementary Material

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posted on 2025-10-15, 12:06 authored by Tong Wei, Logan Fenimore, Tian Lan, John Torkelson

Mathematical details for extracting diffusivity from NRET experiments; ellipsometry data of film thickness, thermal expansivity, and glass transition temperature (PDF).

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