Supplementary Material

journal contribution

posted on 2025-09-03, 12:08 authored by Alexander Bordovalos, Venkanna Kanneboina, Prabin Dulal, Balaji Ramanujam, Ambalanath Shan, Nikolas Podraza

Supplementary Material Document. The same one as previously submitted.

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Related Materials

1.
DOI - Is supplement to <strong>Artificial Neural Network Assisted Spectroscopic Ellipsometry Data Analysis of Hydrogenated Amorphous Silicon Thin Films </strong>

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Information and computing sciences

Keywords

Spectroscopic Ellipsometry Machine Learning

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