Supplementary Material

journal contribution

posted on 2025-06-18, 12:03 authored by Kohei Yamasue, Koki Takano, Taiyo Ishizuka, Yasuo Cho

Additional experimental details, including fabrication and evaluation of insulating tips, sample preparation, and measurement conditions

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Physical sciences

Keywords

Scanning near-field microwave microscopy Insulating tip Local capacitance-voltage profiling van der Waals semiconductors

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