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posted on 2025-02-19, 13:02 authored by Hong Yan, Zhaoting Zhang, Zhi Shiuh Lim, Shengwei Zeng, Jijun Yun, Shuanhu Wang, Yupu Zhang, Kexin Jin
Details of the X-ray reflectivity patterns and XRD of a-LaAlO3 and TiO2 thin films, in-plane magnetoresistance for S10, and temperature dependence of phase coherence length.

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    Applied Physics Letters

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    Two-dimensional electron gases;Titanium oxidePiezoelectric strain modulationElectronic transportsEmerging interface properties

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