Supplement number 1

V L, Ananthu Vijayan; Dawe, Christopher; Vanjari, Sai Charan; Markevich, Vladimir; Halsall, Matthew; Peaker, Anthony; Moorthy Babu, Sridharan; Kuball, Martin

doi:10.60893/figshare.apm.28950617.v1

Supplement number 1

journal contribution

posted on 2025-05-21, 12:05 authored by Ananthu Vijayan V L, Christopher Dawe, Sai Charan Vanjari, Vladimir Markevich, Matthew Halsall, Anthony Peaker, Sridharan Moorthy Babu, Martin Kuball

The details for extracting doping concentration and depletion region width from the capacitance-voltage measurements.

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Semiconductor devices Capacitance- Voltage Analysis

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Supplement number 1

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