supplementary materials

The supplementary material contains XRD patterns of intermediates prepared with different carbon sources after the carbonization treatment and the product of SA carbonized at 900 {degree sign}C (N2) for 2 hours (Fig. S1), SEM, TEM and corresponding element mapping images of raw materials and intermediates (Fig. S2), XRD patterns of IV-Si/C samples and its calcination products (Fig. S3), XPS spectra of SiO2/C intermediate after removal of NaCl and the corresponding core-level spectra of Si 2p, C 1s and O 1s (Fig. S4), and comparison on carbon raw materials, preparation methods and electrochemical properties between IV-Si/C and reported Si/C-based anodes (Table S1).