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posted on 2024-09-26, 12:00 authored by HANXIN LOU, XINGGUO YE, Xin Liao, TONGYANG ZHAO, An-Qi Wang, Dapeng Yu, Zhi-Min Liao
See the supplementary material for more details on device fabrication, transport measurement method, additional measurement data in different devices and for a discussion of the extrinsic effect of contact.

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    Applied Physics Letters

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