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supplementary material
figure
posted on 2024-05-30, 11:51 authored by Jianchao Lin, Qinghua Zhang, Peng Tong, Xuekai Zhang, Xiaoguang Zhu, Tongfei Shi, W. J. Lu, Jie Chen, Yaoda Wu, Huaile Lu, Lunhua He, Bo Bai, Yong Jiang, Wenhai Song, Yuping SunThe supplementary material contains the following information: (1) Sample synthesis and characterization; (2) XRD patterns, NPD patterns and typical Rietveld refinements using GSAS-II program; (3) Detailed NTE properties; (4) EXAFS spectra of Ni K-edge and thermal conductivity for polycrystals; and (5) Additional high-resolution LAADF images for single crystals.
