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posted on 2024-06-27, 11:53 authored by Hao Shen, boxiang zhou, Yuanyuan zhang, Ruijuan Qi, yu'ang chen, Xuefeng Chen, Zhengqian Fu, Genshui Wang, Jing Yang, Wei Bai, Xiaodong Tang, Shujun ZhangMore details about microstructure results (Fig. S1.), temperature dependent dielectric properties (Fig. S2.), switching properties (Fig. S3.), dielectric properties (Fig. S4.), thermal stability (Fig. S5.), frequency stability (Fig. S6.), fatigue properties (Fig. S7.) of all PLHO-x films, and temperature dependent XRD results of PLHO-x (x= 0 and 0.04) (Fig. S8.).
