Unusual tilted growth and epitaxial relationship of NaCl B1-structured NiO and CrN on r-plane Al2O3

The supplementary information includes details on the orientation of NiO films resulting from deposition without substrate rotation. It also features a partial pole figure of {220}CrN and {11 ̅02}Al2O3 with a measurement step of 0.1˚ for φ and ψ, measured on the CrN/r-plane sapphire. Additionally, it contains the simulated stereographical projection of poles from Al2O3 and NiO, as well as a partial list of reflections of interest with their respective positions in the stereographical projection. Finally, it includes the AFM surface morphology images of bare r-Al2O3 substrate and of the NiO film.