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TCAD-based investigation of 1/f noise in advanced 22 nm FDSOI MOSFETs

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posted on 2024-11-13, 13:02 authored by Prabhat Khedgarkar, Mohit Ganeriwala, Pardeep Duhan
1/f noise

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    Applied Physics Letters

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    Keywords

    Noise, Traps, Power Spectral Density, FDSOI

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    CC BY 4.0

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