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Supporting information: Near-field Imaging of Optical Resonances in Si Metasurfaces Using Photoelectron Microscopy

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posted on 2024-06-06, 11:53 authored by Alex Boehm, Sylvain Gennaro, Chloe Doiron, Thomas Beechem, Michael B. Sinclair, Igal Brener, Raktim Sarma, Taisuke Ohta
Supporting information including methods, notes on data analysis, and additional figures.

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    APL Photonics

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    Keywords

    near-field imagingnear-field spectroscopyphotoemission electron microscopy (PEEM)metasurfacenanophotonics

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    CC BY 4.0

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