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https://doi.org/10.60893/figshare.apl.30067339

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posted on 2025-09-24, 12:05 authored by Lingyu Zhang, Yifu Sun, Kaiyue He, Ruhai Liu, Dong Zhang, Peng Lu, Maguang Zhu

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MoS2 field-effect transistors Electron irradiation Radiation tolerance

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