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https://doi.org/10.60893/figshare.jap.29895440

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posted on 2025-09-08, 04:06 authored by Alexis Wartelle, Bruno Da Silva, David Cooper, Martien den Hertog

This material includes suplemental figures, described at the end of the manuscript text.

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DOI - Is supplement to <strong>Sub micro-radian angular detection limits for field mapping by Lorentz 4D scanning transmission electron microscopy on a Si p-n junction</strong>

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Physical sciences

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p-n junction electrical properties deflection detection limit transmission electron microscopy Center of Mass

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