Supporting Information 1
figure
posted on 2024-08-08, 12:04 authored by Subhashree Das, Swikruti Supriya, D Alagarasan, R Ganesan, Ramakanta NaikXRD shift of as-prepared and annealed Se/Bi2Te3 films, FESEM images of 100 oC, 200 oC, and 250 oC annealed film at 100 nm and 1 μm, EDX spectra of 100 oC, 200 oC, and 250 oC annealed films, I-V and Resistance measurement plot of the samples of as-prepared, 100 oC, 200 oC, and 250 oC annealed films, Raman spectra of all the films, Raman photograph at various temperatures of 523 K annealed Se/Bi2Te3 thin films.
