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posted on 2025-09-04, 12:07 authored by Filippo Ozino Caligaris, Md Jayed Hossain, Md Ashiqur Rahman Laskar, Youssry Botros, Milan Pešić, Rob Davenport, Ivan Esqueda, Seth Tongay, Umberto Celano
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    Atomic force microscopyDefect classificationTransition-metal dichalcogenidesPhysics-informed machine learningComputer Vision

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