Supplementary material
figure
posted on 2025-05-02, 12:05 authored by Jingjing Yu, Sijun Luo, Daniel Splith, Susanne Selle, Katrin Thieme, Stephan Gierth, Thorsten Schultz, Peter Schlupp, Chris Sturm, Holger von Wenckstern, Michael Lorenz, Norbert Koch, Thomas Höche, Marius GrundmannAdditional XRD and SEM-EDS analysis results and AFM images, XRR model fitting parameters, TEM images and STEM-EDS spectrum, and UV-vis transmission spectrum.
