AIP Publishing
Browse

Supplementary material

Download (799.34 kB)
figure
posted on 2025-04-22, 12:04 authored by Reika Ota, Nana Sun, Kazuki Okamoto, Shinnosuke Yasuoka, Yoshihiro Ueoka, Daiki Shono, Masami Mesuda, Hiroshi Funakubo
Supplementary material for the analysis of microstructure and composition, as well as raw data of PUND measurement.

History

Related Materials

  1. 1.
    DOI - Is supplement to <strong>Impact of film composition</strong><strong> on crystal structure and </strong><strong>ferroelectricity in (Al<sub>1-<em>x</em>-<em>y</em></sub>Ga<em><sub>x</sub></em>Sc<em><sub>y</sub></em>)N ternary wurtzite thin films</strong>

Usage metrics

    APL Materials

    Categories

    Keywords

    (Al,Ga,Sc)N filmswurtzite-structureFerroelectric property

    Licence

    CC BY 4.0

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC