Supplementary material
figure
posted on 2025-01-27, 05:06 authored by Lin Wang, Li Chen, Xionghu Xu, Zhangchen Hou, Yafang Li, Liyan Shang, Jinzhong Zhang, Liangqing Zhu, Yawei Li, Fei Cao, Genshui Wang, Junhao Chu, Zhigao HuMore fundamental characterizations of MoxV1-xO2 films, (log(R))/dT
curves of all MoxV1-xO2 films, DOS and band structure of undoped VO2, Fermi energy level of different Mo atom count, AFM morphology of the typical
MoxV1-xO2 film, discussion of C-AFM and KPFM measurements of pure VO2 film, additional electrical measurements.
