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posted on 2024-04-01, 04:00 authored by Annett Thø, gersen, Ingvild J. T. Jensen, Torbjø, rn Mehl, Ingunn Burud, Espen Olsen, Inga Gudem Ringdalen, Junjie Zhu and Rune Sø, ndenå
The supplementary section provides STEM images of the samples, FIB lamellas, in addition to detailed STEM analysis of AREA 3 in cross sectional view.<p></p>

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    Journal of Applied Physics

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    TEM, Si, defects

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