Supplementary material

The supplementary material contains images, diagrams, and tables with information for the metal-ferroelectric-metal (MFM) devices fabricated. It also contains details about the characterization of the samples, including X-ray photo spectroscopy (XPS), ellipsometry and polarization-electric field (P-E) testing. The remaining material contains descriptive statistics for the remanent polarization (Pr) values measured, additional details about the analysis of variance (ANOVA), and a more detailed description of the Pr model along with verification of model underlying assumptions.