Supplementary file
figure
posted on 2024-12-18, 13:07 authored by Joseph Strehlow, Lin Yin, Chun-Shang Wong, Scott Luedtke, Sasikumar Palaniyappan, David J. Stark, Chengkun Huang, Alemayehu Bogale, Brandon Cage, Timothy Coffman, Alejandro Figueroa Bengoa, Rebecca Fitzgarrald, La Moyne Mix, Ryan Nedbailo, Dean Rusby, John Schmidt, Justin Twardowski, Ashlyn Van Pelt, Thomas Day, Benjamin Jones, Sandra Bruce, Ahmed Helal, Michael Spinks, Hernan Quevedo, Farhat Beg, Enam Chowdhury, Todd Ditmire, Edison Liang, Alexander Thomas, Juan Fernandez, Donald Gautier, James Hunter, Yongho Kim, Kevin Meaney, Brian AlbrightThe supplementary file associated with this work contains several additional figures that may be of interest to the reader. Figure S1 shows the response function for each image plate layer of the Filter Stack Spectrometer (FSS). Figure S2 shows simulated MeV x-ray spectra generated in MCNP with a 1 mm Ta converter, using the measured electrons from Figure 2a as the input. Figure S3 shows the laser intensity contrast measured at the time of the experiment.
