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Supplementary document

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posted on 2024-05-22, 11:54 authored by Soumen Mandal, Akash Das, Manik Pradhan
Angle of incidence dependence of (a) modulus and (b) phase of reflection coefficient (r_p and r_S) as determined using the slab model for the monolayer WSe2 deposited on the Si/SiO2 substrate

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    Journal of Applied Physics

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