posted on 2024-08-06, 12:02authored byJing Zhou, Lisen Huang, Sherry Yap, Dennis Lin, BingJin Chen, Shaohai Chen, Seng Kai Wong, Jinjun Qiu, James Lourembam, Anjan Soumyanarayanan, Sze Ter Lim
This supplementary material contains results on switching with AFM IEC, characterization with MOKE, ST-RMR, detailed micromagnetic simulation, estimation of PMA energy, additional TEM results, MTJ performance across wafer, MTJ switching ratio, illustration of etching processes on MTJ properties, detailed procedures for measuring switching probability, and a benchmarking table consisting of our design and prior designs.