posted on 2024-06-18, 11:51authored byBayan Kurbanova, Dhritiman Chakraborty, Azat Abdullaev, Anna Shamatova, Oksana Makukha, Ali Belarouci, Vladimir Lysenko, Alexander Azarov, Andrej Yu Kuznetsov, Yanwei Wang, Zhandos Utegulov
Supplementary Material file provided for detailed information about the np-Si fabrication process and structural characterization measurements, Monte-Carlo simulation details, Raman, Ellipsometry, TDTR and FDTR measurement conditions