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posted on 2024-06-10, 04:01 authored by Wenkang Chen, xiangshui wu, Shichen Deng, Nuo Yang, Xiangfan Xu
details of SiC nanowires characterization including X-ray diffraction and Raman spectrum (Figure S1), and the analysis of experimental errors.

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    Applied Physics Letters

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    X-ray diffractionRaman spectrumSiC

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