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posted on 2024-06-07, 11:50 authored by Chen Chen, Saptarsi Ghosh, Peter De Wolf, Zhida Liang, Francesca Adams, Menno Kappers, David Wallis, Rachel Oliver
Supplementary material for Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy

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