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posted on 2024-02-09, 12:55 authored by AIP AdminAIP Admin, Bo Wang, Quanzhi Zhang, Yonghai Guo, Wangda Li, Bo Zhang and Jiangwei Cao
NiO thickness dependence of the exchange bias field,The derivation the NiO thickness dependence of SMR, MR measurement for control sample, and harmonic Hall measurement.

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