posted on 2025-11-05, 13:01authored byMonika Bhakar, Pooja Bhardwaj, Gokul M. Anilkumar, Atikur Rahman, Goutam Sheet
Thickness Analysis using AFM. Additional PFM measurements for critical thickness analysis. Morphology of the sample along with the height profile of the nanoplatelet on which thickness and temperature-dependent PFM experiments were performed, and Kelvin Probe Force Microscopy (KPFM) data.