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posted on 2025-11-11, 13:01 authored by Yujie Zhou, Xiaoyu Qiu, Jie Tu, Yingjia Li, Xiang Xu, Zijian Chen, Chen Zhou, Zhao Guan, Yonghui Zheng, Ni Zhong, Ping-Hua Xiang, Bin-Bin Chen
more details about sample growth, structural and resistivity properties

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    DOI - Is supplement to <strong>On the thickness-driven metal-insulator transition of buried LaNiO<sub>3</sub> films</strong>

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    Applied Physics Letters

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    thin filmmetal-insulator transitiontransport property

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