Supplementary Materials

Figure S1. Nanostructure of SG-CNTs determined by HR-TEM. Figure S2. UV-vis-NIR spectrum (background subtracted) of SWCNTs. Measurements of in-plane thermoelectric properties Figure S3. Raman spectra of SWCNT films with different DODMAC/SWCNT ratios. Figure S4. XPS spectra (C 1s) of SWCNT films with different DODMAC/SWCNT ratios: (a) 10-3, (b) 10-2, (c) 10-1, (d) 1, (e) 10, and (f) 80. Table S1. Comparison of thermoelectric performance of n-type SWCNT films with various dopants. Figure S5. (a) Fabrication process of all-carbon TEG, (b) photograph of completed all-carbon TEG on heater, (c) thermography image during the heating, (d) output voltage of TEG, and (e) maximum power of TEG. Figure S6. Microstructure and chemical structure of SWCNT film at a DODMAC/SWCNT ratio of 80 before and after thermal cycling test. (a) XPS spectra, (b) SEM image before thermal cycling test, and (c) SEM image after thermal cycling test. Range of Raman shift of (a) 50-350 cm-1 and (b) 1250-1750 cm-1.