Supplementary Materials
figure
posted on 2024-12-02, 05:02 authored by Yoann Baron, János Lábár, Stéphane Lequien, Bela Pecz, Richard Daubriac, Sebastien Kerdiles, Pablo Acosta Alba, Christophe Marcenat, Dominique Débarre, François Lefloch, Francesca ChiodiThe Supplementary Material
contains:
- the commented data on X-Ray Diffraction, showing the raw data and the evolution with EL of the diffraction peak position, amplitude, and width, for both 1 and 5 laser anneals.
- the estimation of the layer thickness as a function of EL obtained from three independent measurements of the Time Resolved Reflectivity, the square conductance and the active surface dose.
- the in-plane and out-of-plane lattice deformation profile extracted from the TEM measurements.
