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JAP_Special_Issue_MLThermal_Jarzembski_SM.pdf (35.52 MB)

Supplementary Material: Rapid Subsurface Analysis of Frequency Domain Thermoreflectance Images with K-Means Clustering

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posted on 2024-04-22, 04:02 authored by Amun Jarzembski, Zachary Piontkowski, Wyatt Hodges, Matthew Bahr, Anthony McDonald, William Delmas, Greg Pickrell, Luke Yates
Supplementary Material pertaining to the manuscript: Rapid Subsurface Analysis of Frequency Domain Thermoreflectance Images with K-Means Clustering. Results are presented in the order they are referenced in the manuscript: the full FDTR hyperspectral images for frequencies from 1 kHz to 60 MHz; FDTR performed on SiO2 and doped-Si calibration samples; FDTR sensitivity plots for the pixel-selective thermal analysis; FDTR sensitivity bounding the upper value of G2 that can be determined with the current analysis methods; K-means silhouette plots justifying the use of K = 3 in the current work; Zoomed in colorbar thermophysical property maps; and FDTR buried interface sensitivity for various conditions.

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