Supplementary Material: Rapid Subsurface Analysis of Frequency Domain Thermoreflectance Images with K-Means Clustering

Supplementary Material pertaining to the manuscript: Rapid Subsurface Analysis of Frequency Domain Thermoreflectance Images with K-Means Clustering. Results are presented in the order they are referenced in the manuscript: the full FDTR hyperspectral images for frequencies from 1 kHz to 60 MHz; FDTR performed on SiO2 and doped-Si calibration samples; FDTR sensitivity plots for the pixel-selective thermal analysis; FDTR sensitivity bounding the upper value of G2 that can be determined with the current analysis methods; K-means silhouette plots justifying the use of K = 3 in the current work; Zoomed in colorbar thermophysical property maps; and FDTR buried interface sensitivity for various conditions.