Supplementary Material Figures

Fig. S1. (a)-(b) are measured AFM images of prepared two MoTe2 samples through CVD method. (c)-(d) are the height profiles along the white lines highlighted in (a) and (b), respectively. Fig. S2. (a) AFM image of the fabricated periodic MoTe2 nanostructures after femtosecond laser irradiation. (b) is the height profile along the white line highlighted in (a). Fig. S3. (a) SEM image of the NPs on MoTe2. (b) AFM characterization of the NPs on MoTe2. (c)The measured height profile along the white line which is denoted in (b). Fig. S4. (a) The HAADF image of the heterostructure, (b)-(d) are the corresponding element mappings of Mo, Te, and O, respectively. Fig. S5. HRTEM of the side area of the MoTe2 nanostructures. Fig. S6. Cross-sectional STEM image of 2H-MoTe2 after femtosecond laser irradiation.