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posted on 2025-10-20, 04:09 authored by Solomon Musibau, Kellen Arnold, Anurag Veluri, Jacopo Franco, Artemisia Tsiara, Kristof Croes, Joris Van Campenhout, Ronald Schrimpf, Robert Reed, Ingrid De Wolf, Daniel Fleetwood

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DOI - Is supplement to Low-frequency noise characteristics of waveguide-integrated lateral and vertical Ge-on-Si p-i-n photodiodes

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Ge-on-Si photodiodes Low-frequency noise Reliability

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