AIP Publishing
Browse

Supplementary Material

Download (342.08 kB)
figure
posted on 2025-07-09, 12:04 authored by Yurong Liu, Zhuoxin Zhang, Junfan Zhu, An Wang, Xiong Liu, Rongchun Ge, Zhiyou Zhang
Supplement section 1 for Theoretical analysis for optimal UC deflection angle (incident angle) selection;Supplement section 2 for Imaging quality and Resolution analysis of the AWMD microscopy; Supplement section 3 for Theoretical Analysis of Phase Compensation Mechanisms

History

Related Materials

  1. 1.
    DOI - Is supplement to Adjustable Weak Measurement Differential Microscopy via Flat Differentiator

Usage metrics

    Applied Physics Letters

    Categories

    Keywords

    Principle explanationconceptual graph

    Licence

    CC BY 4.0

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC