AIP Publishing
Browse

Supplementary Material

Download (4.36 MB)
figure
posted on 2025-05-28, 12:04 authored by Yimeng Xu, Caiyang Ye, Wenyao Jiao, Ziyi Dai, Kai Qian
Device fabrication, characterization and testing.

History

Usage metrics

    Applied Physics Letters

    Categories

    Keywords

    device fabricationcharacterizationtesting

    Licence

    CC0

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC