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posted on 2025-04-17, 12:01 authored by Kentaro Yumigeta, Jan Kopaczek, Rounak Banerjee, Seyed Tohid Rajaei Moosavy, Anvesh Yarra, Blake Povilus, Hayley Ruddick, Renee Sailus, Mukesh Kumar, Sushant Lakhavade, Yunbo Ou, Zafer Mutlu, Seth Tongay
Sample preparation, measurements, methodology, and error analysis.

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    Applied Physics Letters

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