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posted on 2025-03-31, 04:01 authored by Miaojia Yuan, Maokun Wu, Yichen Wen, Yilin Hu, Xuepei Wang, Boyao Cui, Jinhao Liu, Yishan Wu, Hong Dong, Feng Lu, Weihua Wang, Pengpeng Ren, Sheng Ye, Hong-Liang Lu, Runsheng Wang, ZHIGANG JI
the detailed comparison of contact resistivity, SOC and defect effect

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    Applied Physics Letters

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    contact resistivityinterface dopingcharge redistributionFirst-principles calculations

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