AIP Publishing
Browse

Supplementary Material

Download (908.71 kB)
figure
posted on 2025-03-26, 12:03 authored by Minjie Zhou, Ao Li, Shuhan Li, Fan Zhang, Zhiqiang Li, Bing Jin
We discussed the effects of NiO film crystallinity, annealing conditions, and thickness on both modulation depth and rate.

History

Usage metrics

    APL Materials

    Categories

    Keywords

    THz ModulatorNiO/Si heterojunctionannealing conditionsfilm thickness

    Licence

    CC BY-NC 4.0

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC