Supplementary Material
figure
posted on 2025-03-17, 04:09 authored by Zihong Cai, Yafei Wang, Zuchong Zhao, Jiacai Liao, Kai Ma, Junyu Lin, Zecheng Diao, Si Ling, Yuanhang Ren, Weiwei Xing, Gongbin Tang, Ji Ran, Zhongwei Liang, Jianhui Zhang, Tao Zou, Fan Zhang, Meicong WangMore crack distribution maps in the device, EDS line-scan SEM maps and AFM maps, device EDS maps, positive-scan J-V and other relevant data.
